- Volumes 84-95 (2024)
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Volumes 72-83 (2023)
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Volume 83
Pages 1-258 (December 2023)
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Volume 82
Pages 1-204 (November 2023)
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Volume 81
Pages 1-188 (October 2023)
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Volume 80
Pages 1-202 (September 2023)
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Volume 79
Pages 1-172 (August 2023)
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Volume 78
Pages 1-146 (July 2023)
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Volume 77
Pages 1-152 (June 2023)
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Volume 76
Pages 1-176 (May 2023)
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Volume 75
Pages 1-228 (April 2023)
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Volume 74
Pages 1-200 (March 2023)
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Volume 73
Pages 1-138 (February 2023)
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Volume 72
Pages 1-144 (January 2023)
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Volume 83
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Volumes 60-71 (2022)
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Volume 71
Pages 1-108 (December 2022)
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Volume 70
Pages 1-106 (November 2022)
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Volume 69
Pages 1-122 (October 2022)
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Volume 68
Pages 1-124 (September 2022)
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Volume 67
Pages 1-102 (August 2022)
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Volume 66
Pages 1-112 (July 2022)
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Volume 65
Pages 1-138 (June 2022)
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Volume 64
Pages 1-186 (May 2022)
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Volume 63
Pages 1-124 (April 2022)
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Volume 62
Pages 1-104 (March 2022)
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Volume 61
Pages 1-120 (February 2022)
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Volume 60
Pages 1-124 (January 2022)
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Volume 71
- Volumes 54-59 (2021)
- Volumes 48-53 (2020)
- Volumes 42-47 (2019)
- Volumes 36-41 (2018)
- Volumes 30-35 (2017)
- Volumes 24-29 (2016)
- Volumes 18-23 (2015)
- Volumes 12-17 (2014)
- Volume 11 (2013)
- Volume 10 (2012)
- Volume 9 (2011)
- Volume 8 (2010)
- Volume 7 (2009)
- Volume 6 (2008)
- Volume 5 (2007)
- Volume 4 (2006)
- Volume 3 (2005)
- Volume 2 (2004)
- Volume 1 (2003)
High performance Dynamic Light Scattering (DLS) has been used to determine the hydrodynamic diameters of CdSe nanocrystals as well as CdSe cluster molecules in a size range of 1 to 10 nm (Eichhöfer et al., 2001). The method enables the determination of their particle size, including their ligand shells, in solution. The results are consistent with the blue shift of the absorption bands, as well as Transmission Electron Microscope (TEM) experiments. The sizes of the cluster molecules were estimated from space filling models constructed from the results of a single crystal X-ray structure determination. DLS gave comparable results for the size of both types of compound, indicating that it is potentially an important additional measurement technique to TEM, which uses harsh measurement conditions, and to powder X-ray diffraction, which is difficult to interpret below 5 nm.