Atomic resolution in noncontact AFM by probing cantilever frequency shifts--颗粒学报PARTICUOLOGY

Xie, H. Y. (2007). Atomic resolution in noncontact AFM by probing cantilever frequency shifts. China Particuology, 5(3), 242–246. https://doi.org/10.1016/j.cpart.2006.09.001

Atomic resolution in noncontact AFM by probing cantilever frequency shifts

Hong Yong Xie ^a *

a Department of Environmental Engineering, Shanghai Second Polytechnic University, 2360 Jin Hai Road, Pudong Shanghai 201209, China

10.1016/j.cpart.2006.09.001

Volume 5, Issue 3, June 2007, Pages 242-246

Received 13 July 2005, Accepted 30 September 2006, Available online 6 June 2007.

E-mail: hyxie@eed.sspu.cn

Highlights

Abstract

Rutile TiO₂ (0 0 1) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [1 1 0] direction over the rutile TiO₂ (0 0 1) quantum dots in ultra high vacuum (UHV), scanning routes were explored to achieve atomic resolution from frequency shift image. The tip–surface interaction forces were calculated from Lennard–Jones (12-6) potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO₂ (0 0 1) surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route.

Graphical abstract

Keywords

Nc-AFM; Frequency shift image; Atomic resolution; Quantum dots; Uncleaved material surface

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