On-line full scan inspection of particle size and shape using digital image processing--颗粒学报PARTICUOLOGY

Liao, C.-W., Yu, J.-H., & Tarng, Y.-S. (2010). On-line full scan inspection of particle size and shape using digital image processing. Particuology, 8(3), 286-292. https://doi.org/10.1016/j.partic.2010.03.015

On-line full scan inspection of particle size and shape using digital image processing

Chih-Wei Liao, Jiun-Hung Yu, Yeong-Shin Tarng^*

Department of Mechanical Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, China

10.1016/j.partic.2010.03.015

Volume 8, Issue 3, June 2010, Pages 286-292

Received 8 May 2009, Revised 6 January 2010, Accepted 18 March 2010, Available online 2 May 2010.

E-mail: D9203204@mail.ntust.edu.tw

Highlights

Abstract

An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image processing. The system is composed of a particle separation module, an image acquisition module, an image processing module, and an electric control module. Experiments are carried out using non-uniform 0.1 mm particles. The main advantage of this system consists of a full analysis of particles without any overlap or miss, thus improving the Area Scan Charge Coupled Device (CCD) acquisition problems. Particle size distribution, roundness, and sphericity can be obtained using the system with a deviation of repeated precision of around ±1%. The developed system is shown to be also convenient and versatile for any particle size and shape for academic and industrial users.

Graphical abstract

Keywords

Particle size distribution; Particle characterization; Image analysis; Line scan CCD; Automatic inspection

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