Measurement of inter-particle forces by an interfacial force microscope--颗粒学报PARTICUOLOGY

Huang, Q., Mesbah-Nejad, A., Tadayyon, S. M., Norton, P., Zhang, H., & Zhu, J. (2010). Measurement of inter-particle forces by an interfacial force microscope. Particuology, 8(5), 400-406. https://doi.org/10.1016/j.partic.2010.05.011

Measurement of inter-particle forces by an interfacial force microscope

Qing Huang ^a, Asghar Mesbah-Nejad ^b, Seyed M. Tadayyon ^c, Peter Norton ^c, Hui Zhang ^a, Jesse Zhu ^a *

a Particle Technology Research Centre, Department of Chemical and Biochemical Engineering, The University of Western Ontario, London, Ontario N6A 5B9, Canada
b Department of Electrical and Computer Engineering, The University of Western Ontario, London, Ontario N6A 5B9, Canada
c Department of Chemistry, The University of Western Ontario, London, Ontario N6A 5B9, Canada

10.1016/j.partic.2010.05.011

Volume 8, Issue 5, October 2010, Pages 400-406

Received 1 December 2009, Revised 13 May 2010, Accepted 21 May 2010, Available online 7 August 2010.

E-mail: jzhu@uwo.ca

Highlights

Abstract

An interfacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1–0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

Graphical abstract

Keywords

Inter-particle forces; van der Waals force; Interfacial force microscope; Fine powder

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