Limits on rough-particle sizing with low-defocus interferometric imaging--颗粒学报PARTICUOLOGY

Brunel, M., Ouldarbi, L., Shen, H., Gréhan, G., & Coëtmellec, S. (2015). Limits on rough-particle sizing with low-defocus interferometric imaging. Particuology, 22, 52-58. https://doi.org/10.1016/j.partic.2014.07.008

Limits on rough-particle sizing with low-defocus interferometric imaging

M. Brunel ^*, L. Ouldarbi, H. Shen, G. Gréhan, S. Coëtmellec

Département Optique et Lasers, CORIA–UMR CNRS 6614, Université de Rouen, Avenue de l’Université, BP 12, F-76801 Saint-Etienne du Rouvray Cedex, France

10.1016/j.partic.2014.07.008

Volume 22, October 2015, Pages 52-58

Received 30 April 2014, Revised 15 July 2014, Accepted 27 July 2014, Available online 19 December 2014, Version of Record 4 August 2015.

E-mail: marc.brunel@coria.fr

Highlights

• A theoretical model was proposed to describe the aperture in interferometric out-of-focus imaging.

• Influence of aperture on speckle-like patterns created by rough particles was investigated.

• The domain of validity of rough-particle sizing with out-of-focus imaging was determined.

Abstract

We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregular, rough particles. Finally, we determine the conditions under which these patterns are no longer representative of particle size but of the aperture itself and the defocus parameter.

Graphical abstract

Keywords

Interferometric out-of-focus imaging; Irregular rough particles; Generalized Huygens–Fresnel integrals

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