Numerical study of particle motion near a charged collector--颗粒学报PARTICUOLOGY

Zuo, Z., Wang, J., Huo, Y., & Xu, R. (2017). Numerical study of particle motion near a charged collector. Particuology, 32, 103-111. https://doi.org/10.1016/j.partic.2016.05.017

Numerical study of particle motion near a charged collector

Ziwen Zuo, Junfeng Wang ^*, Yuanping Huo, Rongbin Xu

School of Energy and Power Engineering, Jiangsu University, Zhenjiang 212013, China

10.1016/j.partic.2016.05.017

Volume 32, June 2017, Pages 103-111

Received 20 January 2016, Revised 17 April 2016, Accepted 9 May 2016, Available online 13 January 2017, Version of Record 20 April 2017.

E-mail: wangjunfeng@ujs.edu.cn

Highlights

• Particles impacting on a charged collector were simulated taking three impact modes into account.

• A criterion based on particle velocity was presented to identify particle submersion into droplet.

• Particle impact angle decreased with decreasing Kc number or increasing St number.

Abstract

The behavior of particles impacting the surface of a charged droplet involves adhesion, rebound, and submersion. In the present study, a numerical model for simulating particle impacts on charged droplets is presented that takes into account the various impact modes. With the droplet considered as a solid boundary, the criterion for rebounding is that the particle's impact angle is <85°. The simulated trajectories of the particles are verified by comparing with experimental data for low-velocity particles to assess the reliability of the model. For impact angles >85°, particles undergo three distinct modes depending on normal impact velocities. The critical velocity of adhesion/rebound and rebound/submersion is used to identify the mode that the particles are undergoing. The criteria are also verified by comparing with analytical data. The results show that the impact angle of particles increases with increasing Coulomb number and decreases dramatically with increasing Stokes number, both of which lead to a high probability for particle rebound.

Graphical abstract

Keywords

Wet electrostatic scrubbing; Charged droplet; Particle trajectories; Particle deposition

文章导读